CZ-Si wafer 4 inch 525 um (100) SSP P-doped
Test CZ-Si wafer 525 µm 100
| Quantity | Unit price |
|---|---|
| To 49 |
€11.00*
|
| To 99 |
€10.70*
|
| To 299 |
€10.50*
|
| To 499 |
€10.00*
|
| To 999 |
€9.50*
|
| To 1999 |
€9.00*
|
| From 2000 |
€8.80*
|
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Product number:
WSM40525250P1324XNN1
Product information "CZ-Si wafer 4 inch 525 um (100) SSP P-doped"
Test CZ-Si wafer 4 inch, thickness = 525 ± 25 µm, (100), 1-side polished, n-type (Phosphor), 1 - 20 Ohm cm, 1 Flat
| Diameter (round): | 4 inch |
|---|---|
| Material: | CZ-Si |
| Orientation: | 100 |
| Quality: | Test |
| Resistivity: | 1 - 10 Ohm cm |
| Surface: | 1-side polished |
| Thickness: | 501 - 700 µm |