CZ-Si wafer 3 inch 381 um (100) SSP B-doped
Test CZ-Si wafer 381 µm 100
Quantity | Unit price |
---|---|
To 49 |
€9.00*
|
To 99 |
€8.50*
|
To 299 |
€8.00*
|
From 300 |
€7.20*
|
Send us an inquiry if you have any questions about articles, purchase quantities, delivery times or sample requests!
Product number:
WSM30381250B1324SNN1
Product information "CZ-Si wafer 3 inch 381 um (100) SSP B-doped"
Test CZ-Si wafer 3 inch, thickness = 381 ± 25 µm, (100), 1-side polished, p-type (Boron), 1 - 20 Ohm cm
Diameter (round): | 3 inch |
---|---|
Material: | CZ-Si |
Orientation: | 100 |
Quality: | Test |
Resistivity: | 1 - 10 Ohm cm |
Surface: | 1-side polished |
Thickness: | 301 - 400 µm |