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CZ-Si wafer 6 inch 675 um (100) SSP B-doped

Test CZ-Si wafer 675 µm 100

Product information "CZ-Si wafer 6 inch 675 um (100) SSP B-doped"

Test CZ-Si wafer 6 inch, thickness = 675 ± 25 µm, (100), 1-side polished, p-type (Boron) 1 - 10 Ohm cm

Diameter (round): 6 inch
Material: CZ-Si
Orientation: 100
Quality: Test
Resistivity: 1 - 10 Ohm cm
Surface: 1-side polished
Thickness: 501 - 700 µm