CZ-Si wafer 4 inch 625 um (100) SSP B-doped

Test CZ-Si wafer 625 µm 100
Quantity Unit price
To 49
€12.00*
To 99
€11.00*
To 199
€10.70*
From 200
€10.50*
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Product number: WSM4062525XB1314SNN1
Product information "CZ-Si wafer 4 inch 625 um (100) SSP B-doped"

Test CZ-Si wafer 4 inch, thickness = 625 ± 25 µm, (100), 1-side polished, p-type (Boron), 1 - 10 Ohm cm, 2 SEMI flats

Diameter (round): 4 inch
Material: CZ-Si
Orientation: 100
Quality: Test
Resistivity: 1 - 10 Ohm cm
Surface: 1-side polished
Thickness: 501 - 700 µm