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CZ-Si wafer 4 inch 525 um (100) SSP P-doped

Prime CZ-Si wafer 525 µm 100

Product information "CZ-Si wafer 4 inch 525 um (100) SSP P-doped"

Prime CZ-Si wafer 4 inch, thickness = 525 ± 25 µm, (100), 1-side polished, n-type (Phosphor), TTV < 10 µm, 0.01 - 0.1 Ohm cm

Diameter (round): 4 inch
Material: CZ-Si
Orientation: 100
Quality: Prime
Resistivity: 0.01 - 0.1 Ohm cm
Surface: 1-side polished
Thickness: 501 - 700 µm