CZ-Si wafer 4 inch 525 um (100) SSP B-doped
Test CZ-Si wafer 525 µm 100
| Quantity | Unit price |
|---|---|
| To 999 |
€8.40*
|
| From 1000 |
€8.40*
|
No longer available - availability check on request
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Product number:
WSM40525250B1324SNN3
Product information "CZ-Si wafer 4 inch 525 um (100) SSP B-doped"
Test CZ-Si wafer 4 inch, thickness = 525 ± 25 µm, (100), 1-side polished, p-type (Boron) TTV < 10 µm, Bow < 40 µm, 1 - 20 Ohm cm, SEMI Flat 32.5 mm. Laser-marking class 100 "LAAS 2021 TESTXXXX"