CZ-Si wafer 3 inch 381 um (100) SSP B-doped
Test CZ-Si wafer 381 µm 100
| Quantity | Unit price |
|---|---|
| To 49 |
€9.00*
|
| To 99 |
€8.50*
|
| To 299 |
€8.00*
|
| From 300 |
€7.20*
|
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Product number:
WSM30381250B1324SNN1
Product information "CZ-Si wafer 3 inch 381 um (100) SSP B-doped"
Test CZ-Si wafer 3 inch, thickness = 381 ± 25 µm, (100), 1-side polished, p-type (Boron), 1 - 20 Ohm cm
| Diameter (round): | 3 inch |
|---|---|
| Material: | CZ-Si |
| Orientation: | 100 |
| Quality: | Test |
| Resistivity: | 1 - 10 Ohm cm |
| Surface: | 1-side polished |
| Thickness: | 301 - 400 µm |