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CZ-Si wafer 2 inch 500 um (100) SSP B-doped

Test CZ-Si wafer 500 µm 100

Product information "CZ-Si wafer 2 inch 500 um (100) SSP B-doped"

Test CZ-Si wafer 2 inch, thickness = 500 ± 15 µm, (100), 1-side polished, p-type (Boron), TTV < 10 µm, 1 - 20 Ohm cm

Diameter (round): 2 inch
Material: CZ-Si
Orientation: 100
Quality: Test
Resistivity: 1 - 10 Ohm cm
Surface: 1-side polished
Thickness: 401 - 500 µm