CZ-Si wafer 2 inch 279 um (100) SSP B-doped
Test CZ-Si wafer 279 µm 100
| Quantity | Unit price |
|---|---|
| To 49 |
€6.50*
|
| To 99 |
€6.00*
|
| To 299 |
€5.50*
|
| To 999 |
€5.20*
|
| To 1999 |
€5.00*
|
| From 2000 |
€4.80*
|
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Product number:
WSM20279250B1324SNN1
Product information "CZ-Si wafer 2 inch 279 um (100) SSP B-doped"
Test CZ-Si wafer 2 inch, thickness = 279 ± 25 µm, (100), 1-side polished, p-type (Boron), 1 - 20 Ohm cm
| Diameter (round): | 2 inch |
|---|---|
| Material: | CZ-Si |
| Orientation: | 100 |
| Quality: | Test |
| Resistivity: | 1 - 10 Ohm cm |
| Surface: | 1-side polished |
| Thickness: | 201 - 300 µm |